Dr. Juan Bautista Hurtado Ramos

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Phone +52 (55) 5729 6000 Ext. 81006

Field of Expertise

Image Analysis

Dr. Hurtado Ramos received his engineering degree on electronics and comunications from the Universidad de Guadalajara, earned his Ph.D. at the Centro de Investigaciones en Óptica, with his degree awarded by the Universidad de Guanajuato. His doctoral research focused on integrated optics and planar waveguides. Subsequently, he has worked in optical metrology, specializing in interferometric techniques, particularly laser speckle, interferometric image processing and Particle Image Velocimetry (PIV).

He has been a faculty member at IPN-CICATA Querétaro since 2005. He has also served as a visiting researcher at the Department of Applied Physics at the University of Vigo and at institutes within the Valencian Technological Institute System, particularly with the Association of Optics, Color, and Imaging Industries (AIDO) also with the University of Technology in Sidney. He was a Senior Researcher at CIDESI, contributing to the Gran Telescopio de Canarias project, collaborating to the developing a fiber-optic hydrocarbon leak sensor, leading the development of an interferometer for optical plane calibration, and working on the Colorimeter Radiometer project, which patent has been conceded in 2004. Three other patents have been conceded to his team since then, including a 3D scanning system, a speckle panoramic interferometer and a system to measure mechanical properties of laminated materials.

Dr. Hurtado Ramos has been collaborating on projects with companies such as CONDUMEX, MIDE, MABE, Eurowelding, Mess and others. As the head of the research center, he is part of the education commission of COPARMEX, an enterprise private organization and the innovation commission of CANACINTRA, a commission in charge of promote the collaboration between industry, academy and government. He is a member of SPIE, OSA, and IEEE. He has actively participated in organizing several academic and research conferences. He has published mor than 66 articles in international journals and conference proceedings in the field of optical metrology. Dr. Hurtado Ramos has been a member of the National System of Researchers since 1998.